Unveiling Emotional Stress: Analyzing EEG Signals With Deep Learning Insights
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Unveiling Emotional Stress: Analyzing EEG Signals With Deep Learning Insights
Aishwarya B N1, Sahana Prasad H G2, Roopashree C S3
1Student, B.E [Information Science and Engineering], BNM Institute of Technology, Bangalore
2Student, B.E [Information Science and Engineering], BNM Institute of Technology, Bangalore
3Assistant Professor, Dept. of Information Science and Engineering, BNM Institute of Technology, Bangalore
Abstract - This study focuses on a comprehensive exploration of EEG-based emotion recognition, with a particular focus on leveraging recurrent neural network (RNN) architectures, including long short-term memory (LSTM) and gated recurrent unit (GRU). The investigation is rooted in a publicly available EEG Brainwave Dataset, meticulously curated to capture human responses to emotional stimuli. The dataset features signals obtained from frontal and temporal brain lobes, categorized into distinct emotional states encompassing positive, neutral, and negative emotions. The analysis spans four distinct scenarios, each representing different combinations of features and preprocessing strategies. Notably primary emphasis is on LSTM and GRU architectures due to their proven effectiveness in sequential data processing tasks. In addition to evaluating the performance of LSTM and GRU models a thorough examination of all the four cases to assess their efficacy in accurately predicting emotional states from EEG signals. The study also emphasis on the importance of meticulous feature selection and preprocessing in optimizing model accuracy and robustness, highlighting the intricate interplay between data representation, model architecture, and task-specific requirements. Ultimately, the research findings contribute to advanced understanding of EEG-based emotion recognition and pave the way for further research in this exciting interdisciplinary field.
Key Words: Electroencephalography(EEG), Long short-term memory (LSTM), Gated recurrent unit (GRU), Feature extraction, Preprocessing techniques, Statistical metrics, Frequency domain analysis.
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